Group Delay Dispersion
www.edmundoptics.co.uk/LO 5
Shack-Hartmann
Wavefront Sensors
• Transmitted and reflected
wavefront measurements down
to λ/10 from 266nm to 1100nm
• Quantifying high departure
wavefronts as in spherical
aberration plates
• Used to evaluate large dynamic
range wavefront changes in
components and assemblies
• Spectrally-resolved white light
interferometers to accurately
measure group delay dispersion
(GDD) of multilayer ultrafast optics
• Ultra-broadband spectral
coverage ranging from 250nm
to 2500nm
• GDD measurement accuracy of
±5 fs2 at angles of incidence
between 0° and 75° at S- and
P-polarizations
• Highest accuracy measurement
equipment for transmitted and
reflected wavefront distortion
capable of measuring <λ/20
surface irregularity
• Multiple phase-shift
interferometers, including
stitching, large- and small-
aperture, and computer generated
hologram (CGH) configurations
• Used to qualify flat, spherical,
and aspherical components and
optical assemblies
Learn more about our capabilities.
Visit www.edmundoptics.co.uk/metrology
Measurement
Interferometers
/LO
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