Extreme Ultraviolet (EUV) Flat Mirrors
58 lenses windows filters polarizers & waveplates prisms beamsplitters laser optic assemblies mirrors
• Maximum Achievable Reflection at 13,5 nm
• Designed for EUV Beam Steering and Harmonic Separation
• 5° and 45° AOI Versions Available
+44 (0) 1904 788600 | Edmund Optics®
Substrate: Single Crystal Silicon
Diameter (mm): 25,40 ±0,25
Thickness (mm): 6,35 ±0,508
Surface Roughness (RMS Å): < 3
Surface Flatness: λ/10
Wavelength Range (nm) FWHM (nm) Coating Specification Stock No. Price
13,18 - 13,68 0,98 R > 60% @ 13,5 nm @ 5° AOI #38-759 €2.200,000
12,92 - 13,90 0,50 R > 65% @ 13,5 nm @ 45° AOI #38-760 €2.200,00
Call For Custom Capabilities and OEM Quantity Pricing
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