www.edmundoptics.eu/LO 5
Shack-Hartmann
Wavefront Sensors
• Transmitted and reflected
wavefront measurements down
to λ/10 from 266 nm to 1100 nm
• Quantifying high departure
wavefronts as in spherical
aberration plates
• Used to evaluate large dynamic
range wavefront changes in
components and assemblies
• Spectrally-resolved white light
interferometers to accurately
measure group delay dispersion
(GDD) of multilayer ultrafast optics
• Ultra-broadband spectral
coverage ranging from 250 nm
to 2500 nm
• GDD measurement accuracy of
±5 fs2 at angles of incidence
between 0° and 75° at S- and
P-polarizations
• Highest accuracy measurement
equipment for transmitted and
reflected wavefront distortion
capable of measuring <λ/20
surface irregularity
• Multiple phase-shift
interferometers, including
stitching, large- and small-
aperture, and computer generated
hologram (CGH) configurations
• Used to qualify flat, spherical,
and aspherical components and
optical assemblies
Learn more about our capabilities.
Visit www.edmundoptics.eu/metrology
Group Delay Dispersion
Measurement
Interferometers
/LO
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