If You Can't Measure It,
You Can't Make It
Atomic Force
Microscope (AFM)
• High accuracy characterizations of
surface roughness and feature
sizes and locations
• Lateral spatial frequency range of
30 - 50.000 cycles/mm
• Vertical resolution down to 0,1 nm
• Ideal for highly-precise measure -
ments in a laboratory setting
4 +44 (0) 1904 788600 | Edmund Optics®
• White light interferometry for
surface roughness characterization
• Lateral spatial frequency range of
1 - 1.800 cycles/mm
• Measures <1Å RMS surface
roughness for flat optics
• Short measurement times and
little maintenance required,
resulting in high throughput
in production
• High accuracy total loss
measurements based on Cavity
Ring-Down Spectroscopy (CRDS)
with sensitivity in the parts
per million
• Tuned for common Nd:YAG
harmonics (355 nm, 532 nm, and
1064 nm) – other wavelengths
available upon request
• Accurately quantifies both high
and low reflectivity laser optics
Learn how we can help you.
Visit www.edmundoptics.eu/LO
Superpolished Surface
Roughness Measurement
Cavity Ring-Down
Loss Meter
/LO